The 15th Annual Workshop on SIMS will be held in Clearwater, Florida, April 29th through May 2, 2002. The goal of the workshop is to provide an informal forum for the interchange of information about SIMS. Sessions are typically devoted to methods of analysis, instrumentation and fundamentals. Special topic tutorial sessions are held on new and emerging aspects of the technique. This year's Workshop will deal with the practical aspects of secondary ion mass spectrometry. A selection of proposed special topic areas include fundamentals, ultra-shallow depth profiling, instrumental developments, fundamentals of organic SIMS, geology/isotopic measurements, insulator analysis, quantification and polymer characterization. The format of the workshop is informal, with topics of interest to both the novice and experienced SIMS user. Both oral and poster sessions are planned. All participants are invited to submit an abstract of work to be presented at the conference. You are also encouraged to bring a few overhead transparencies illustrating novel applications of SIMS to present in discussions.