On behalf of the
Organizing Committee, I cordially invite you to participate at the 16th
International Conference on Secondary Ion Mass Spectrometry, SIMS XVI to
be held at Ishikawa Ongakudo (Concert Hall & Hogaku Hall) in Kanazawa
from October 29 to November 2, 2007. This series of the conferences has
become the representative forum on the recent developments, future of SIMS
technology and its related topics.
SIMS XVI will cover all aspects
of SIMS: fundamentals, instrumentation, methodology, and application in
various fields, such as semiconductors, industrial materials, biological,
medical, earth/planet, and environmental sciences.
We will have two
parallel sessions through the week, and two poster sessions. Plenary
lectures will be given at the opening session on Monday morning. In
addition to the ordinary scientific session programs, we will also have
special “Discussion Day “ programs which were initiated at the last
Manchester meeting, with comprehensive topics on the fundamentals of SIMS
technique and discussion on bioanalysis and Imaging by SIMS and related
Techniques. The conference will also be held in conjunction with the
6th International Symposium on Atomic Level Characterization for New
Materials and Devices (ALC’07), which will provide
participants another chance to understand SIMS phenomena from different
points of view.
More than four hundred attendees from different
countries are expected for the conference. It will offer you the
opportunity to present your work and to exchange information on the
development of SIMS technique with scientists and engineers from all over
Some social events (excursion, conference dinner, and
some others) are also planned. You will see numbers of historical places
and buildings together with colored leaves in fall.
We are looking
forward to seeing you in Kanazawa.