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PRESENTATIONS FROM SIMS XVIII, September 18-23, 2011    Trentino, Italy

Nick Winograd, Penn State University, SIMS XVIII
SIMS Fundamentals ZIP  354MB Ionization, Ionization and Ionization ZIP  1.6MB
Quantification ZIP  313kb Molecular Depth Profiling ZIP  14.9MB
2-D and 3-D Imaging ZIP  89.6MB Instrumentation ZIP  4.9MB
Plenary Section Lecture, SIMS XVIII PDF 192kb  
Prof. John Vickerman, Surface Analysis Research Center, Manchester UK, SIMS XVIII
3D Molecular Bio-imaging using SIMS hype or real prospect? ZIP 35MB
Fred Stevie, North Carolina State University, SIMS XVIII
Depth Profiling PDF 2.56MB Quantification PDF  896KB
Insulators & Residual Gases PDF  372KB Instrumentation PDF  1.04MB
Ultra Shallow Analyses PDF 804KB Applications PDF  1.43MB
Dynamic SIMS Analysis Day, Damiano PDF  2.05MB  

Ian Gilmore, National Physical Laboratory UK, SIMS XVIII

Surface mass spectrometry of organics and nano-objects
Part I - Instrument optimisation and practical analysis PDF 4MB
Part 3 -Analysis of nano-objects PDF 6MB

A Guide to the Practical Use of Multivariate Analysis in SIMS PDF 3MB

 

   
   
   
   

420
D. Mao, C. Lu, N. Winograd and A. Wucher, "Molecular Depth Profiling by Wedged Crater Beveling", Anal. Chem., 16, 6410-6417 (2011).
419
D. A. Brenes, B. J. Garrison, N. Winograd, Z. Postawa, A. Wucher and P. Blenkinsopp, "Fluid Flow and Effusive Desorption: Dominant Mechanisms of Energy Dissipation after Energetic Cluster Bombardment of Molecular Solids", J. Phys. Chem. Lett., 2, 2009-2014 (2011).
418
J. S. Fletcher, J. C. Vickerman and N. Winograd, "Label free biochemical 2D and 3D imaging using secondary ion mass spectrometry", Current Opinion in Chemical Biology, 15, 1-8 (2011).
417
M. K. Passarelli and N. Winograd, "Lipid imaging with time-of-flight secondary ion mass spectrometry (ToF-SIMS)", Biochimica et Biophysica Acta - Molecular and Cell Biology of Lipids, online (2011).
416
Z. Postawa, L. Rzeznik, R. Paruch, M. F. Russo, N. Winograd and B. J. Garrison, "Depth profiling by cluster projectiles as seen by computer simulations", Surface and Interface Analysis, 43, 12-15 (2011).
415
L. L. Zheng, A. Wucher and N. Winograd, "Retrospective sputter depth profiling using 3D mass spectral imaging", Surface and Interface Analysis, 43, 41-44 (2011).
414
D. Willingham, D. A. Brenes, N. Winograd and A. Wucher, "Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals", Surface and Interface Analysis, 43, 45-48 (2011).
413
D. A. Brenes, D. Willingham, N. Winograd and Z. Postawa, "Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectiles", Surface and Interface Analysis, 43, 78-80 (2011).
412
C. Lu, A. Wucher and N. Winograd, "Fundamental studies of depth profiling using organic delta layers as model systems", Surface and Interface Analysis, 43, 81-83 (2011).
411
C. Lu, A. Wucher and N. Winograd, "Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C-60) cluster ions", Surface and Interface Analysis, 43, 99-102 (2011).
410
M. K. Passarelli and N. Winograd, "Characterizing in situ Glycerophospholipids with SIMS and MALDI Methodologies", Surface and Interface Analysis, 43, 269-271 (2011).
409
A. Wucher, A. Kucher, N. Winograd, C. A. Briner and K. D. Kranzman, "Sputtered neutral SinCm clusters as a monitor for carbon implantation during C60 bombardment of silicon", Nuclear Inst. And Methods in Physics Research B , 269, 1300-1305 (2011).
408
C. Lu, A. Wucher and N. Winograd, "Molecular Depth Profiling of Buried Lipid Bilayers using C60-Secondary Ion Mass Spectrometry", Anal. Chem., 83, 351-358 (2011).
 

History of Magnetic Sector SIMS

Charles A. Evans, Jr., PhD, Evans Analytical Group

Some Theories (& History) of Sputtered Ion Formation

Peter Williams, Arizona State University

History of Static SIMS

Nicholas Winograd, Penn State University

History of Quad SIMS

Charles W. Magee, Chief Scientist, Evans Analytical Group

Graph of Past Attendance

at International SIMS Meetings